Xiaohao Yang earned his undergraduate degree from Tsinghua University in Material Science (Beijing, China), and now enrolled in Ph.D. program in Dept. of Applied Physics and Applied Mathematics, Columbia University. He has a board range of interests, including studying the atomic structure of semiconductor quantum dots using Pair Distribution Functions; statistic uncertainties analysis and reliability study in data reduction; studying the heterogeneous structure of nano-scale structure in meso-scale using computed tomography PDF(ctPDF). He also works on developing software, including 2D powder diffraction image processing Python package diffpy.srxplanar and commercial end-to-end PDF analysis software solution xPDFsuite and ePDFsuite.
1. A. N. Beecher, X. Yang, J. H. Palmer, A. L. LaGrassa, P. Juhás, S. J. L. Billinge and J. S. Owen, Atomic Structures and Gram Scale Synthesis of Three Tetrahedral Quantum Dots, J. Am. Chem. Soc. 136, 10645-10653 (2014)
2. J. J. Choi, X. Yang, Z. M. Norman, S. J. L. Billinge and J. S. Owen,Structure of methylammonium lead iodide on mesoporous titanium dioxide: active material in high performance metal-organic solar cells, Nano Lett. 14, 127–133 (2014)
3. X. Yang, P. Juhás and S. J. L. Billinge, On the estimation of statistical uncertainties on powder diffraction and small-angle scattering data from two-dimensional X-ray detectors, J. Appl. Crystallogr. 47, 1273-1283 (2014)
4. S. D. Jacques, M. D. Michiel, S. A. J. Kimber, X. Yang, R. J Cernik, A. M Beale, S. J. L. Billinge, Pair distribution function computed tomography, Nat. Commun. 4, 2536 (2013)